Example Customizations

Automated Positioning for Complex Sample Characterization

Published on May. 19, 2026

Upright microscope with platform to move sample in 6 DOF

The Challenge:

In semiconductor inspection and materials science , performing Raman spectroscopy on large or irregularly shaped samples present a primary hurdle: maintaining orthogonality. This is especially challenging when capturing features from multiple angles including such as when inspecting the angled sidewalls of micro-features. Traditional microscope setups fail here for two reasons:

  • Insufficient Clearance: Fixed-frame microscopes lack the vertical space to accommodate large samples when they are angled to view the sides of components.
  • Limited Maneuverability: Standard XY stages cannot provide the pitch, roll, and rotation needed to dynamically tilt and rotate the sample so the camera and laser can access all sides of the features.
  • Consequently, researchers are often forced to choose between degraded data quality or destructive sectioning of the sample to make it fit.

The Outcome:

A system that ensures the laser beam can reach any side of a sample by combining:

  • Vertical Clearance: The imaging core is mounted on an extended column, creating a large "open volume" to accommodate tilting the sample.
  • Total Surface Access: Rather than just moving left-to-right (XY), the platform uses a multi-axis stack to pitch, roll, and rotate the sample.

The Engineering Approach:

Rather than building a costly, ground-up custom machine, Zaber utilized a modular design using off-the-shelf motorized stages. This approach ensures high performance without the lead times or expense of bespoke manufacturing.

The 6-DoF capability is achieved by layering standard Zaber modules and controlled by Zaber's universal software:

  • Imaging: An MKR microscope core with a 25 mm focus stage, mounted to an MTR500A extended column for maximum clearance.
  • Positioning: An X-ASR100 XY stage serves as the base, supporting an X-RSM rotary stage and two X-GSM goniometers for tip/tilt (pitch and roll) control.
    Simplified Integration:
    The build is powered by Zaber’s integrated control architecture, which eliminates cluttered external hardware:
  • Single-Cable Setup: Every stage features a built-in controller and driver. Units daisy-chain together to share power and data, requiring only a single cable to the computer.
  • Universal Software: Motion is managed via the open-source API. In this case, a Python routine fully orchestrates the complex, multi-angle revolutionary scan sequences enabling the collection of thousands of data points seamlessly.
  • Hardware Sync: Built-in TTL I/O on the stages allows for direct, seamless triggering of third-party Raman hardware.

Our product customization team is able to complete most customizations within a two-week period. Contact us with your requests.